발간논문

Home > KJMM 논문 > 발간논문

Vol.45, No.11, 609 ~ 615, 2007
Title
Thickness Analysis of ε and γ`-iron Nitride Using X-ray Diffraction
김윤기 Yoon Kee Kim
Abstract
Thicknesses of ε and γ`-iron nitride in bilayer(ε/γ`) compound were estimated using x-ray diffraction. The validity of formulation model was checked by comparing calculations with metallographic analysis of iron nitride compound layer grown on steels with gas nitriding. The thicknesses of ε and γ`-iron nitride formed on SPHC steel estimated by the model using ε(111) and γ`(200) diffraction intensity were 2μm and 1.7μm respectively. These are well matched with the results measured by microscope. The calculated thicknesses of the compound layers grown on low alloy steels well agree to the results measured by microscope. However, the estimated results for high alloy steels are thicker than metallographic analysis.
Key Words
x-ray diffraction, iron-nitride, thickness analysis, bilayer compound model
| PDF
대한금속∙재료학회 │ (06633) 서울시 서초구 서초대로 56길 38 대한금속∙재료학회 회관 (서초1동 1666-12번지)
Tel : 070-4266-1646 │ FAX : 02-557-1080 │ E-mail : metal@kim.or.kr
Copyright ⓒ 2013 사단법인 대한금속∙재료학회 All rights reserved.