High Resolution Transmission Electron Microscopy observation and Image Simulation Study of Twins in GaAs
이병택Byung Teak Lee, 이정용Jeong Y . Lee
Abstract
Two types of twins with different atomic structure may exist in GaAs, rotation type and reflection type. An extensive computer simulation was performed of high resolution transmission electron microscopy (HRTEM) images of the two types of twins in GaAs. At the same time, a twin in a practical GaAs crystal was observed with a high-performance HRTEM. Results of simulation study showed that HRTEM images of the two different twins have noticeable differences at certain optimum conditions. However, experimental HRTEM images recorded at the corresponding conditions did not reveal the fine details to show the type of the twin.