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Vol.13, No.2, 146 ~ 153, 1975
Title
Dislocation Mobility in Silicon Single Crystals
최선근 Choi Sun Keun
Abstract
The average velocities of 60°-dislocations in silicon single crystals have been measured be Stein and Low method. The stress dependence of dislocation velocities is described as v∝τ^m at a given temperature over the stress range of 0.5∼5 ㎏/㎟. It was observed that stress exponent m depended on temperature. The temperature dependence of dislocation velocities is described as v∝exp (-E/kT) with activation energy of 1.5 electron volt at the resolved shear stress of 2 ㎏/㎟.
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