Relationship between Flaws in Anodic Ta2O5 Films and Scintillation during Anodization
이동녕Dong Nyung Lee, 윤용구Young Ku Yoon
Abstract
Flaws of a new shape in anodic Ta₂O_5 films on tantalum foils formed in aqueous solutions of phosphoric acid were observed by electron microscopy. A mechanism for the formation of the flaws is proposed by the present study. Modes of scintillation were dependent upon anodizing solutions used. Crystals formed during anodization of tantalum foils were identified as β-Ta₂O_5. Scintillation voltages at reanodization after MnO₂ application were closely related to flaws and stresses in the anodic oxide films. Namely, scintillation voltages decreased with increasing number of flaws and increasing stresses in the films.